URC97020 Off-Line Testing for Bridge Faults in CMOS Domino Logic Circuits

نویسندگان

  • K. Bennett
  • P. K. Lala
چکیده

Bridge faults, especially in CMOS circuits, have unique characteristics which make them difficult to detect during testing. This paper presents a technique for detecting bridge faults which have an effect on the output of CMOS Domino logic circuits. The faults are modeled at the transistor leveI and .lhis technique is based on analyzing the off-set of the function during off-line testing.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Physical design for testability for bridges in CMOS circuits

Present research in design for testability has largely been connned to the logic level. In this paper we present directions for research in design for testability at the layout or physical design level. These are illustrated for bridge faults in circuits consisting of CMOS standard cells.

متن کامل

Detecting resistive shorts for CMOS domino circuits

We investigate defects in CMOS domino gates and derive the test conditions for them. Very-Low-Voltage Testing can improve the defect coverage, which we define as the maximum detectable resistance, of intra-gate and inter-gate resistive shorts. We also propose a new keeper design for CMOS domino circuits. The new keeper design has low performance impact and is best useful for small CMOS domino g...

متن کامل

Low Power 8x8 Bit CMOS Multiplier Using 65nm Technology

This paper presents low power 8x8 bit multipliers which are implemented with Tanner Tool v13.0 at 500MHz frequency with 65nm technology which is having a supply voltage 1.0v. There are different CMOS multiplier circuits are analyzed names as Braun multiplier, Wallace tree multiplier, Row bypass Braun multiplier, Column bypass Braun multiplier, Row and Column bypass Braun multiplier and these mu...

متن کامل

Detecting Fabrication Faults in C-elements

C-elements are used widely in asynchronous VLSI circuits. Fabrication faults in some C-elements can be undetectable by logic testing. Testable designs of static CMOS Celements are given in this paper which provide for the detection of single line stuck-at and stuck-open faults. We show that driving the feedback transistors in the proposed testable static C-element transforms its sequential func...

متن کامل

Optimal Unate Decomposition Method for Synthesis of Mixed Cmos Vlsi Circuits

Static CMOS logic style is often the choice of designers for synthesizing low power circuits. This style is robust in terms of noise integrity however, it offers less speed. Domino logic style, as an alternative is often found in critical paths of various large scale high performance circuits. Yet, due to high switching activity they are not suitable for synthesis of low power circuits. To achi...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 1996